{"created":"2023-07-25T10:24:29.245144+00:00","id":1804,"links":{},"metadata":{"_buckets":{"deposit":"a1f58602-bc73-4f75-953e-b1ec08e8306a"},"_deposit":{"created_by":1,"id":"1804","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1804"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001804","sets":["54:383:405"]},"author_link":["10415","10412","10414","10413"],"item_3_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1993-10-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"94","bibliographicPageEnd":"98","bibliographicPageStart":"91","bibliographicVolumeNumber":"93","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告. 設計自動化研究会報告"}]}]},"item_3_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本稿では,並列テスト生成において生成されるテストパターン数について考察する.複数のプロセッサで同時にテストパターンを生成する並列テスト生成では,一台のプロセッサによる処理に比べて多くのテストパターンを生成する傾向にある.本稿では,生成されるテストパターン数とそのパターンによって検出される故障数との関係を定式化し,並列テスト生成によって生成されるテストパターン数を解析する.さらに,プロセッサ間通信の生成されるテストパターン数への影響について解析し,効果的な通信方法を示す. ","subitem_description_type":"Abstract"},{"subitem_description":"In this paper, we consider the test set size produced in parallel test generation for logic circuits. Since in a multiple processor system, each processor generates test-patterns independently and simultaneously, the total set of test-patterns tends to be larger than that generated by a single processor system. In this paper, we formulate the relation between the number of generatd test-patterns (test set size) and the number of faults detected by the patterns, and analyze the total number of test-patterns produced in parallel test generation. Further, we analyze the influence of communication among processors on the number of test-patterns, and show an effective method of communication which can obtain a small size of test set in parallel test generation.","subitem_description_type":"Abstract"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会"}]},"item_3_relation_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"110002930397","subitem_relation_type_select":"NAID"}}]},"item_3_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"情報処理学会"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ipsj.or.jp/","subitem_relation_type_select":"URI"}}]},"item_3_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"ここに掲載した著作物の利用に関する注意：本著作物の著作権は（社）情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。 "},{"subitem_rights":"The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan."},{"subitem_rights":"本文データは学協会の許諾に基づきCiNiiから複製したものである。"}]},"item_3_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN1011091X","subitem_source_identifier_type":"NCID"}]},"item_3_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"井上, 智生"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10412","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤原, 秀雄"},{"creatorName":"フジワラ, ヒデオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10413","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10414","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"FUJIWARA, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10415","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-05-26"}],"displaytype":"detail","filename":"110002930397.pdf","filesize":[{"value":"667.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"110002930397.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1804/files/110002930397.pdf"},"version_id":"2960ea54-ec0e-47cc-8592-8fe3a5fddd3e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト生成","subitem_subject_scheme":"Other"},{"subitem_subject":"並列処理","subitem_subject_scheme":"Other"},{"subitem_subject":"マルチプロセッサ","subitem_subject_scheme":"Other"},{"subitem_subject":"故障並列法","subitem_subject_scheme":"Other"},{"subitem_subject":"テストパターン数","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"並列テスト生成におけるテストパターン数について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"並列テスト生成におけるテストパターン数について"},{"subitem_title":"On the Test Set Size in Parallel Test Generation","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["405"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-05-26"},"publish_date":"2023-05-26","publish_status":"0","recid":"1804","relation_version_is_last":true,"title":["並列テスト生成におけるテストパターン数について"],"weko_creator_id":"1","weko_shared_id":1},"updated":"2023-07-25T10:32:40.531325+00:00"}