{"created":"2023-07-25T10:24:25.816068+00:00","id":1749,"links":{},"metadata":{"_buckets":{"deposit":"597208be-7a25-4b48-83fc-2e28d9786a2c"},"_deposit":{"created_by":1,"id":"1749","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1749"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001749","sets":["54:383:397"]},"author_link":["10074","10072","10078","10081","10080","10076","10075","10077","10073","10079"],"item_3_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-11-27","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"120","bibliographicPageEnd":"48","bibliographicPageStart":"43","bibliographicVolumeNumber":"2003","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告. SLDM, [システムLSI設計技術]"}]}]},"item_3_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"大規模集積回即こ対するテスト生成を効率よく行う方法として,階層テスト生成法[2]がある.本研究では,階層テスト容易化設計法である,強可検査性に基づくレジスタ転送レベルデータパスのテスト容易化設計法[3]の改良について考察する.従来法[3]を構成する手続きの1つである制御林生成アルゴリズムに着目し,生成される制御経路のタイミング衝突(1つの外部入力から,1つのモジュールの異なる2つの入力までの制御経路の順序深度が等しいこと)の発生を回避するヒューリスティックアルゴリズムを提案する.この結果,ホールド機能を付加するレジスタ数を削減することができる.さらに,モジュールの入力に接続されたレジスタの情報をタイミング衝突の尺度で表現することで,提案するアルゴリズムが,従来法[3]の制約条件を満たさないデータパスに対しても, 有効なテストプランを生成可能であることを示す.実験により,提案するヒューリスティックアルゴリズムが,追加するホールド機能(ハードウエアオーバヘッド)およびテスト実行時間を削減できることを示す.","subitem_description_type":"Abstract"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会"}]},"item_3_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"情報処理学会"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ipsj.or.jp/","subitem_relation_type_select":"URI"}}]},"item_3_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"本著作物の著作権は（社）情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。 "},{"subitem_rights":"The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan."},{"subitem_rights":"本文データは学協会の許諾に基づきCiNiiから複製したものである."}]},"item_3_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_3_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09196072","subitem_source_identifier_type":"ISSN"}]},"item_3_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"岡本, 直己"},{"creatorName":"オカモト, ナオキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10072","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"市原, 英行"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10073","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10074","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"細川, 利典"},{"creatorName":"ホソカワ, トシノリ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10075","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤原, 秀雄"},{"creatorName":"フジワラ, ヒデオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10076","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"OKAMOTO, Naoki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10077","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10078","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10079","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HOSOKAWA, Toshinori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10080","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"FUJIWARA, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10081","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-05-26"}],"displaytype":"detail","filename":"110002687599.pdf","filesize":[{"value":"645.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"110002687599.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1749/files/110002687599.pdf"},"version_id":"a25d7e17-d675-46c6-9228-45521960983b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"階層テスト","subitem_subject_scheme":"Other"},{"subitem_subject":"強可検査性","subitem_subject_scheme":"Other"},{"subitem_subject":"データパス","subitem_subject_scheme":"Other"},{"subitem_subject":"テストプラン","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"強可検査性に基づくデータパスのテストプラン生成アルゴリズムの改良について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"強可検査性に基づくデータパスのテストプラン生成アルゴリズムの改良について"},{"subitem_title":"An Improvement of the Test Plan Generation Algorithm for Strongly Testable Datapaths","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["397"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-05-26"},"publish_date":"2023-05-26","publish_status":"0","recid":"1749","relation_version_is_last":true,"title":["強可検査性に基づくデータパスのテストプラン生成アルゴリズムの改良について"],"weko_creator_id":"1","weko_shared_id":1},"updated":"2023-07-25T10:33:13.000348+00:00"}