{"created":"2023-07-25T10:24:25.580655+00:00","id":1744,"links":{},"metadata":{"_buckets":{"deposit":"255949b6-e7ac-40cf-9b73-9518280bc022"},"_deposit":{"created_by":1,"id":"1744","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1744"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001744","sets":["54:383:397"]},"author_link":["10036","10034","10041","10039","10038","10040","10037","10035"],"item_3_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"111","bibliographicPageEnd":"132","bibliographicPageStart":"127","bibliographicVolumeNumber":"2008","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告. SLDM, [システムLSI設計技術]"}]}]},"item_3_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"遅延故障のテスト手法として，スキャンベースの遅延テストであるハイブリッド遅延テストが文献 [1] で提案されている．ハイブリッド遅延テストは，一部のフリップフロップ （FF） をスキュードロード FF （SL-FF） として制御し，残りの FF をブロードサイド FF （BS-FF）として制御することができるハイブリッドスキャン設計により実現する．本研究では，ハイブリッド遅延テストにおける故障検出率の向上を目的として，FF の伝搬支配性に着目した SL-FF 選択のためのヒューリスティック尺度を提案し，それに基づくハイブリッドスキャン設計を行う．また，ハイブリッドスキャン設計された回路はブロードサイドテストも行えることに着目し，ハイブリッド遅延テストと組み合わせた効率的なテスト実行法を述べる．実験では遷移故障の検出率を評価し，提案する SL-FF 選択法の有効性を示す.","subitem_description_type":"Abstract"},{"subitem_description":"The hybrid delay scan design [1], where part of FFs can be controlled as skewed-load ones, is an effective method for achieving high delay fault coverage with a small hardware penalty. In this work, we propose a heuristic measure for selecting skewed-load FFs (SL-FFs) based on propagation dominance, referring to the ability of FFs to propagate errors, and present a method for designing hybrid scan based on the proposed measure. Experimental results show that our proposed hybrid scan design is effective in fault coverage and fault efficiency, compared to the previous method [1], especially along with the broad-side test application.","subitem_description_type":"Abstract"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会"}]},"item_3_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ipsj.or.jp/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ipsj.or.jp/","subitem_relation_type_select":"URI"}}]},"item_3_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"ここに掲載した著作物の利用に関する注意：本著作物の著作権は（社）情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。"},{"subitem_rights":" The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan."}]},"item_3_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_3_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09196072","subitem_source_identifier_type":"ISSN"}]},"item_3_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"怒和, 友美"},{"creatorName":"ヌワ, トモミ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10034","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"吉川, 祐樹"},{"creatorName":"ヨシカワ, ユウキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10035","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"市原, 英行"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10036","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10037","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"NUWA, Tomomi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10038","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"YOSHIKAWA, Yuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10039","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10040","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10041","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-05-26"}],"displaytype":"detail","filename":"IPSJ-SLDM08137022.pdf","filesize":[{"value":"987.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"IPSJ-SLDM08137022.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1744/files/IPSJ-SLDM08137022.pdf"},"version_id":"66d421cb-51c8-491d-80c7-dee3d7ff7ece"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"遅延故障テスト","subitem_subject_scheme":"Other"},{"subitem_subject":"ハイブリッドスキャン設計","subitem_subject_scheme":"Other"},{"subitem_subject":"スキュードロードFF選択","subitem_subject_scheme":"Other"},{"subitem_subject":"伝搬支配性","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"伝搬支配性に着目した遅延テストのためのハイブリッドスキャン設計","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"伝搬支配性に着目した遅延テストのためのハイブリッドスキャン設計"},{"subitem_title":"A Hybrid Delay Scan for Delay Testing Based on Propagation Dominance","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["397"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-05-26"},"publish_date":"2023-05-26","publish_status":"0","recid":"1744","relation_version_is_last":true,"title":["伝搬支配性に着目した遅延テストのためのハイブリッドスキャン設計"],"weko_creator_id":"1","weko_shared_id":1},"updated":"2023-07-25T10:38:58.987212+00:00"}