{"created":"2023-07-25T10:24:25.532806+00:00","id":1743,"links":{},"metadata":{"_buckets":{"deposit":"32c8747d-df00-4837-bc0f-ea0804645090"},"_deposit":{"created_by":1,"id":"1743","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1743"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001743","sets":["54:383:397"]},"author_link":["10028","10029","10031","10030","10026","10033","10032","10027"],"item_3_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"111","bibliographicPageEnd":"126","bibliographicPageStart":"121","bibliographicVolumeNumber":"2008","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告. SLDM, [システムLSI設計技術]"}]}]},"item_3_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本研究では，テストポイント挿入によるテストデータ量の削減法を考案する．故障の中には，同じ信号線に異なる値の割当を必要とするため，同一のテストパターンでは検出できない関係にある故障が存在する．これらの故障はテストポイントの挿入によりその必須割当の衝突を解消でき，同じテストパターンで検出可能となる場合がある．本研究ではこの事実に着目し，テストポイント挿入により解消される必須割当の衝突解消度を示す評価尺度とその評価尺度に基づくスキャン設計のためのテストポイント挿入アルゴリズムを提案する．実験により，テストデータ量を最小にする最適なテストポイント数が存在すること，また，従来法の尺度に比べて提案する評価尺度がテストパターン数を削減可能であることを示す．提案するテストポイント挿入法は少ないテストポイントでテストパターン数だけでなくテストデータ量の削減が可能である． ","subitem_description_type":"Abstract"},{"subitem_description":" In this work, we discuss a method for reducing test data by test point insertion. Focusing on the fact that test points can resolve conflicts among faults that require different assignments to identical signal lines for detection, we propose a measure of test points for the ability to resolve such fault conflict based on necessary assignments for fault detection. We also present an algorithm for inserting test points in scan design based on the proposed test point measure. The analytical results with experiments show that, there exists an optimal number of test points which minimizes the amount of test data (or the test application time). Experimental results show that our test point insertion method is effective in reducing the test data volume, not just the number of test patterns, with a few test points, and the proposed test point measure is more effective in reducing the test patterns than the mesure reported in previous works.","subitem_description_type":"Abstract"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会"}]},"item_3_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ipsj.or.jp/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ipsj.or.jp/","subitem_relation_type_select":"URI"}}]},"item_3_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"本著作物の著作権は（社）情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。 "},{"subitem_rights":" The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan."}]},"item_3_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_3_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09196072","subitem_source_identifier_type":"ISSN"}]},"item_3_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"平本, 和子"},{"creatorName":"ヒラモト, カズコ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10026","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"吉川, 祐樹"},{"creatorName":"ヨシカワ, ユウキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10027","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"市原, 英行"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10028","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"10029","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HIRAMOTO, Kazuko","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10030","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"YOSHIKAWA, Yuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10031","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10032","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10033","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-05-26"}],"displaytype":"detail","filename":"IPSJ-SLDM08137021.pdf","filesize":[{"value":"954.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"IPSJ-SLDM08137021.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1743/files/IPSJ-SLDM08137021.pdf"},"version_id":"c7ad50be-0d5b-41c3-be97-ee329f1e18b2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テストポイント","subitem_subject_scheme":"Other"},{"subitem_subject":"テストデータ量削減","subitem_subject_scheme":"Other"},{"subitem_subject":"含意操作","subitem_subject_scheme":"Other"},{"subitem_subject":"必須割当","subitem_subject_scheme":"Other"},{"subitem_subject":"故障の衝突","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical report","resourceuri":"http://purl.org/coar/resource_type/c_18gh"}]},"item_title":"テストデータ削減のための必須割当に基づくテストポイント挿入法","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"テストデータ削減のための必須割当に基づくテストポイント挿入法"},{"subitem_title":"A Test Point Insertion Method for Test Data Reduction Based on Necessary Assignment","subitem_title_language":"en"}]},"item_type_id":"3","owner":"1","path":["397"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-05-26"},"publish_date":"2023-05-26","publish_status":"0","recid":"1743","relation_version_is_last":true,"title":["テストデータ削減のための必須割当に基づくテストポイント挿入法"],"weko_creator_id":"1","weko_shared_id":1},"updated":"2023-07-25T10:39:00.153954+00:00"}