{"created":"2023-07-25T10:24:00.601961+00:00","id":1312,"links":{},"metadata":{"_buckets":{"deposit":"c49cf919-3022-472d-8849-a44f77337d72"},"_deposit":{"created_by":1,"id":"1312","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1312"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001312","sets":["1:211"]},"author_link":["4525","4522","4521","4523","4526","4524"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-10-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"1473","bibliographicPageStart":"1466","bibliographicVolumeNumber":"E85-D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会(IEICE)"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2002IEICE"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"OGAWA, Atsuhiro"},{"creatorName":"オガワ, アツヒロ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TAMURA, Akiko"},{"creatorName":"タムラ, アキオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"市原, 英行","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"井上, 智生","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"E85-D_10 _1466.pdf","filesize":[{"value":"308.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"E85-D_10 _1466.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1312/files/E85-D_10 _1466.pdf"},"version_id":"20af8063-f18d-4e03-9c14-12a9250ffc73"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"VLSI test"},{"subitem_subject":"test compression"},{"subitem_subject":"statistical code"},{"subitem_subject":"test generation"},{"subitem_subject":"automatic test equipment"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Test Generation for Test Compression Based on Statistical Coding","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Test Generation for Test Compression Based on Statistical Coding"}]},"item_type_id":"10001","owner":"1","path":["211"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1312","relation_version_is_last":true,"title":["Test Generation for Test Compression Based on Statistical Coding"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:47:34.871329+00:00"}