@article{oai:hiroshima-cu.repo.nii.ac.jp:00001312,
 author = {ICHIHARA, Hideyuki and OGAWA, Atsuhiro and INOUE, Tomoo and TAMURA, Akiko and 市原, 英行 and 井上, 智生},
 issue = {10},
 journal = {IEICE Transactions on Information and Systems},
 month = {Oct},
 note = {application/pdf, Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.},
 pages = {1466--1473},
 title = {Test Generation for Test Compression Based on Statistical Coding},
 volume = {E85-D},
 year = {2002},
 yomi = {イチハラ, ヒデユキ and オガワ, アツヒロ and イノウエ, トモオ and タムラ, アキオ}
}