{"created":"2023-07-25T10:24:00.535018+00:00","id":1311,"links":{},"metadata":{"_buckets":{"deposit":"6eb20dd9-081d-48bb-b43b-4110a5121a2f"},"_deposit":{"created_by":1,"id":"1311","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1311"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001311","sets":["1:211"]},"author_link":["4516","4519","4517","4518","4520"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"161","bibliographicPageStart":"158","bibliographicVolumeNumber":"E88-D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会(IEICE)"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2005 IEICE"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4516","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"SHINTANI, Michihiro"},{"creatorName":"シンタニ, ミチヒロ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4517","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4518","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"市原, 英行","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4519","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4520","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"E88-D_1_158.pdf","filesize":[{"value":"106.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"E88-D_1_158.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1311/files/E88-D_1_158.pdf"},"version_id":"4fff97ea-5ae0-4688-b149-b15251b76873"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Huffman code","subitem_subject_scheme":"Other"},{"subitem_subject":"test compression","subitem_subject_scheme":"Other"},{"subitem_subject":"test response","subitem_subject_scheme":"Other"},{"subitem_subject":"test application time","subitem_subject_scheme":"Other"},{"subitem_subject":"ATE","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Huffman-Based Test Response Coding","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Huffman-Based Test Response Coding"}]},"item_type_id":"10001","owner":"1","path":["211"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1311","relation_version_is_last":true,"title":["Huffman-Based Test Response Coding"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:47:36.324795+00:00"}