{"created":"2023-07-25T10:24:00.401683+00:00","id":1309,"links":{},"metadata":{"_buckets":{"deposit":"81b98a36-3bfe-4cff-ad7b-b542a2abf8c7"},"_deposit":{"created_by":1,"id":"1309","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1309"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001309","sets":["1:211"]},"author_link":["4511","4508","4510","4507","4509"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-03-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"762","bibliographicPageStart":"756","bibliographicVolumeNumber":"E91-D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper proposes a self-test method of coarse grain dynamically reconfigurable processors (DRPs) without hardware overhead. In the method, processor elements (PEs) compose a test frame, which consists of test pattern generators (TPGs), processor elements under test (PEUTs) and response analyzers (RAs), while testing themselves one another by changing test frames appropriately. We design several test frames with different structures, and discuss the relationship of the structures to the numbers of contexts and test frames for testing all the functions of PEs. A case study shows that there exists an optimal test frame which minimizes the test application time under a constraint.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会(IEICE)"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2008IEICE"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"INOUE, Tomoo"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4507","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"FUJII, Takashi"},{"creatorName":"フジイ, タカシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4508","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4509","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4510","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"市原, 英行","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4511","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"E91-D_3 _756.pdf","filesize":[{"value":"809.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"E91-D_3 _756.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1309/files/E91-D_3 _756.pdf"},"version_id":"515226bb-8287-42ca-80e7-cae4a99d06f1"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"dynamically reconfigurable processors","subitem_subject_scheme":"Other"},{"subitem_subject":"self-test","subitem_subject_scheme":"Other"},{"subitem_subject":"optimal contexts","subitem_subject_scheme":"Other"},{"subitem_subject":"test application time","subitem_subject_scheme":"Other"},{"subitem_subject":"test frames","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A Self-Test of Dynamically Reconfigurable Processors with Test Frames","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Self-Test of Dynamically Reconfigurable Processors with Test Frames"}]},"item_type_id":"10001","owner":"1","path":["211"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1309","relation_version_is_last":true,"title":["A Self-Test of Dynamically Reconfigurable Processors with Test Frames"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:47:39.650230+00:00"}