{"created":"2023-07-25T10:24:00.263688+00:00","id":1307,"links":{},"metadata":{"_buckets":{"deposit":"40cabc9f-15a1-4859-a55f-45b2d59ebe36"},"_deposit":{"created_by":1,"id":"1307","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1307"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001307","sets":["1:211"]},"author_link":["4499","4500","4496","4498","4497"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-03-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"719","bibliographicPageStart":"713","bibliographicVolumeNumber":"E91-D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Test compression / decompression scheme for reducing the test application time and memory requirement of an LSI tester has been proposed. In the scheme, the employed coding algorithms are tailored to a given test data, so that the tailored coding algorithm can highly compress the test data. However, these methods have some drawbacks, e.g., the coding algorithm is ineffective in extra test data except for the given test data. In this paper, we introduce an embedded decompressor that is reconfigurable according to coding algorithms and given test data. Its reconfigurability can overcome the drawbacks of conventional decompressors with keeping high compression ratio. Moreover, we propose an architecture of reconfigurable decompressors for four variable-length codings. In the proposed architecture, the common functions for four codings are implemented as fixed (or non-reconfigurable) components so as to reduce the configuration data, which is stored on an ATE and sent to a CUT. Experimental results show that (1) the configuration data size becomes reasonably small by reducing the configuration part of the decompressor, (2) the reconfigurable decompressor is effective for SoC testing in respect of the test data size, and (3) it can achieve an optimal compression of test data by Huffman coding.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会(IEICE)"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2008 IEICE"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4496","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"SAIKI, Tomoyuki"},{"creatorName":"サイキ, トモユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4497","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4498","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"市原, 英行","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4499","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4500","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"E91-D_3 _713.pdf","filesize":[{"value":"417.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"E91-D_3 _713.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1307/files/E91-D_3 _713.pdf"},"version_id":"0097d364-fc65-4363-be6e-1236ea75d2ad"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"test compression","subitem_subject_scheme":"Other"},{"subitem_subject":"ATE","subitem_subject_scheme":"Other"},{"subitem_subject":"reconfigurability","subitem_subject_scheme":"Other"},{"subitem_subject":"variable-length coding","subitem_subject_scheme":"Other"},{"subitem_subject":"test application","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"An Architecture of Embedded Decompressor with Reconfigurability for Test Compression","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An Architecture of Embedded Decompressor with Reconfigurability for Test Compression"}]},"item_type_id":"10001","owner":"1","path":["211"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1307","relation_version_is_last":true,"title":["An Architecture of Embedded Decompressor with Reconfigurability for Test Compression"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:47:43.717303+00:00"}