{"created":"2023-07-25T10:23:57.498360+00:00","id":1267,"links":{},"metadata":{"_buckets":{"deposit":"c9a2a013-8e8a-4170-9282-b0914c437213"},"_deposit":{"created_by":1,"id":"1267","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1267"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001267","sets":["1:203"]},"author_link":["4277","4276","4275","4274"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-06-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"1028","bibliographicPageStart":"1021","bibliographicVolumeNumber":"J88-D-I","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. D-I, 情報・システム, I-情報処理"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"VLSIのテスト実行時のコストを削減するために, 統計型符号を用いたテストデータ圧縮・展開法が提案されている. この手法では, 与えられたテスト集合をあらかじめ圧縮しておき, テスト時に展開することを行う. 文献[10]では, テスト集合生成時に統計型符号による圧縮率が高まるようにテスト生成を行う手法が提案されており, 高い圧縮率をもつテスト集合が生成できることが報告されている. 本論文では, 文献[10]に動的テストコンパクションを併用することで, 高い圧縮率を保ったまま, テストベクトル数の小さいテスト集合を生成可能な手法を提案する. ベンチマーク回路に対する実験結果は, 提案手法が小さい計算時間で高圧縮かつコンパクトなテスト集合を生成でき, 結果としてテストデータ量を小さくできることを示している.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2005 IEICE"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11341020","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09151915","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"市原, 英行"},{"creatorName":"イチハラ, ヒデユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4274","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4275","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ICHIHARA, Hideyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4276","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4277","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"j88-d1_6_1021.pdf","filesize":[{"value":"257.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"j88-d1_6_1021.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1267/files/j88-d1_6_1021.pdf"},"version_id":"ccddfd1b-9575-4464-bb21-8b3c53b298b1"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"VLSI","subitem_subject_scheme":"Other"},{"subitem_subject":"テストデータ圧縮","subitem_subject_scheme":"Other"},{"subitem_subject":"統計型符号","subitem_subject_scheme":"Other"},{"subitem_subject":"テスト生成","subitem_subject_scheme":"Other"},{"subitem_subject":"テスト圧縮","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高圧縮可能かつコンパクトなテスト生成について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高圧縮可能かつコンパクトなテスト生成について"},{"subitem_title":"A Test Generation for Compressible and Compact Test Sets","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"1","path":["203"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1267","relation_version_is_last":true,"title":["高圧縮可能かつコンパクトなテスト生成について"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:49:00.029339+00:00"}