{"created":"2023-07-25T10:23:56.175318+00:00","id":1242,"links":{},"metadata":{"_buckets":{"deposit":"17955a21-1e7a-4be8-b76a-2ad39455c164"},"_deposit":{"created_by":1,"id":"1242","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1242"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001242","sets":["1:202"]},"author_link":["4095","4099","4097","4096","4094","4098"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998-03-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"327","bibliographicPageStart":"318","bibliographicVolumeNumber":"J81-D-1","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. D-I, 情報・システム, I-コンピュータ"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"筆者らは先に組合せ回路のテスト生成アルゴリズムでテスト生成可能な順序回路として, 平衡構造を拡張した内部平衡構造順序回路を提案した.本論文ではその内部平衡構造に基づく部分スキャン設計法およびそのテスト生成法を提案する.更に, 順序回路内のフリップフロップに限らず信号線をバイパスフリップフロップ(スキャンとバイパスの機能を有するフリップフロップ)に置き換え, テスト生成容易な順序回路に変換する拡張部分スキャン設計の手法を取り入れ, 核回路を内部平衡構造とする拡張部分スキャン設計法を提案する.この拡張部分スキャン設計において, スキャン化による面積オーバヘッドを小さくするフリップフロップや信号線を選択する方法を述べる.また, 核回路を内部平衡構造とする部分スキャン設計および拡張部分スキャン設計された回路について, 核回路に対するテスト生成法とスキャン化により新たに付加した回路のテスト生成法について述べ, これらのテスト生成法を用いて生成されるテスト系列が正しいテスト系列であることの正当性を示す.更に, ベンチマーク回路に対する実験結果より, 提案した部分スキャン設計および拡張部分スキャン設計が少ない面積オーバヘッドで実現できることを示す.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_10001_relation_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"110003315687","subitem_relation_type_select":"NAID"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©1998 IEICE"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10071319","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-1915","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"高崎, 智也"},{"creatorName":"タカサキ, トモヤ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4094","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井上, 智生"},{"creatorName":"イノウエ, トモオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4095","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤原, 秀雄"},{"creatorName":"フジワラ, ヒデオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"4096","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"TAKASAKI, Tomoya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4097","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOUE, Tomoo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4098","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"FUJIWARA, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4099","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"j81-d1_3_318.pdf","filesize":[{"value":"688.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"j81-d1_3_318.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1242/files/j81-d1_3_318.pdf"},"version_id":"1bf930fe-2e2d-404e-8ee8-7792fd51d12c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"順序回路","subitem_subject_scheme":"Other"},{"subitem_subject":"テスト生成","subitem_subject_scheme":"Other"},{"subitem_subject":"内部平衡構造","subitem_subject_scheme":"Other"},{"subitem_subject":"バイパスフリップフロップ","subitem_subject_scheme":"Other"},{"subitem_subject":"拡張部分スキャン設計","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"内部平衡構造に基づく部分スキャン設計法に関する考察","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"内部平衡構造に基づく部分スキャン設計法に関する考察"}]},"item_type_id":"10001","owner":"1","path":["202"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1242","relation_version_is_last":true,"title":["内部平衡構造に基づく部分スキャン設計法に関する考察"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:49:45.426946+00:00"}