{"created":"2023-07-25T10:23:55.434177+00:00","id":1228,"links":{},"metadata":{"_buckets":{"deposit":"0bedeab4-f73e-45f0-8d24-bbda93a68f57"},"_deposit":{"created_by":1,"id":"1228","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1228"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001228","sets":["1:201"]},"author_link":["3998","3992","3994","3996","3999","3995","3997","3993","3991"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageEnd":"2216","bibliographicPageStart":"2207","bibliographicVolumeNumber":"J92-D","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. D, 情報・システム"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"無閉路可検査順序回路は実用的にテスト容易な順序回路であり,その一つのクラスとして完全スルー可検査順序回路がある.完全スルー可検査性に基づくテスト容易化設計では,完全スキャン設計に比べて小さい面積オーバヘッドでテスト実行時間の小さいテスト系列を生成できる.本論文では,無閉路可検査性を満たす新たな順序回路のクラスとして,部分スルー可検査順序回路を提案し,部分スルー可検査順序回路に対するテスト生成法,並びに,部分スルー可検査性に基づくテスト容易化設計法を示す.部分スルー可検査性は,完全スルー可検査性のスルー機能に関する十分条件を緩和することで定義され,よって,部分スルー可検査順序回路のクラスは完全スルー可検査順序回路のクラスを真に包含する.実験により,部分スルー可検査性に基づくテスト容易化設計は,完全スルー可検査性に基づくそれに比べて実用的に更なる面積オーバヘッドの削減が可能なだけでなく,テスト実行時間も削減可能であることを示す.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_10001_relation_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"110007482414","subitem_relation_type_select":"NAID"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2009 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Testability","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"1","path":["201"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1228","relation_version_is_last":true,"title":["部分スルー可検査性に基づく順序回路のテスト生成法"],"weko_creator_id":"1","weko_shared_id":1},"updated":"2023-07-25T10:31:31.008217+00:00"}