{"created":"2023-07-25T10:23:54.981407+00:00","id":1220,"links":{},"metadata":{"_buckets":{"deposit":"9a3a708b-2f8b-49f8-a132-893bfc4d388b"},"_deposit":{"created_by":1,"id":"1220","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"1220"},"status":"published"},"_oai":{"id":"oai:hiroshima-cu.repo.nii.ac.jp:00001220","sets":["1:200"]},"author_link":["3929","3930"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-09-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicPageEnd":"488","bibliographicPageStart":"482","bibliographicVolumeNumber":"J78-C2","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. C-II, エレクトロニクス, II-電子素子・応用"}]}]},"item_10001_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"実効チャネル長の抽出方法の精度を調べるために,そこで使用される最小2乗法における誤差の振舞いを調べた.その結果,「抽出に使用するデータ数を増やすことは主に測定データ値のばらつきを抑える効果をもち,部分的ではあるが測定誤差の低減にも効果をもつ」ことが明らかになった.次に,この結果に基づき実測データを用いた実効チャネル長の抽出結果を考察した.使用した試料においては,短チャネルMOSFETで設計チャネル長と実効チャネル長の間の線形関係のずれが大きくなる傾向が見られた.このような場合,使用するMOSFETとして長短両チャネルMOSFETを含むなるべく多くのMOSFETを使うことが好ましいことがわかった.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_10001_relation_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"110003314765","subitem_relation_type_select":"NAID"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.ieice.org/jpn/trans_online/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/trans_online/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©1995 IEICE"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10071294","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-1907","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"寺田, 和夫"},{"creatorName":"テラダ, カズオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"3929","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"TERADA, Kazuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"3930","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-02-28"}],"displaytype":"detail","filename":"J78-C2_9_482.pdf","filesize":[{"value":"469.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"J78-C2_9_482.pdf","url":"https://hiroshima-cu.repo.nii.ac.jp/record/1220/files/J78-C2_9_482.pdf"},"version_id":"546b7402-b4cf-425d-a5b9-f8b8a96cb9f3"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"MOSFET","subitem_subject_scheme":"Other"},{"subitem_subject":"実効チャネル長","subitem_subject_scheme":"Other"},{"subitem_subject":"測定誤差","subitem_subject_scheme":"Other"},{"subitem_subject":"最小2乗法","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"実効チャネル長抽出における測定誤差","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"実効チャネル長抽出における測定誤差"}]},"item_type_id":"10001","owner":"1","path":["200"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-02-28"},"publish_date":"2023-02-28","publish_status":"0","recid":"1220","relation_version_is_last":true,"title":["実効チャネル長抽出における測定誤差"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-07-25T10:50:21.298981+00:00"}